The patterned Si nanowire arrays have been successfully fabricated by combining photolithography and metal-assisted Si chemical etching.The morphologies of the arrays are characterized by scanning electron microscopy (SEM). The experimental results reveal that field electron emission from the arrays can be obtained. The patterned Si nanowire arrays is beneficial to patterned electron beams with a low divergence angle. The investigation results provided an efficient way to fabricate the patterned Si nanowire arrays electron sources for various vacuum microelectron devices with some advantages such as
simple process and suitable for IC technology.
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