Analysis of Horizontal Block Stripe in TFT-LCD Panel in Switching-off Process

LU Lin-lin; XU Shuai

doi:10.3788/YJYXS20112604.0464

您当前的位置：

首页 >

文章列表页 >

Analysis of Horizontal Block Stripe in TFT-LCD Panel in Switching-off Process

Device Technology & Physics | 更新时间：2020-08-12

- Analysis of Horizontal Block Stripe in TFT-LCD Panel in Switching-off Process
- Chinese Journal of Liquid Crystals and Displays Vol. 26, Issue 4, Pages: 464-468(2011)
- 作者机构：
  
  北京京东方光电科技有限公司北京,100176
- 作者简介：
- 基金信息：
- DOI：10.3788/YJYXS20112604.0464
  CLC： TN27
- Received：11 March 2010，
  
  Revised：08 April 2010，
  
  Published Online：20 August 2011，
  
  Published：20 August 2011
- 稿件说明：
移动端阅览
路林林, 徐帅. TFT-LCD关机横纹缺陷分析[J]. 液晶与显示, 2011,26(4): 464-468

LU Lin-lin, XU Shuai. Analysis of Horizontal Block Stripe in TFT-LCD Panel in Switching-off Process[J]. , 2011,26(4): 464-468
路林林, 徐帅. TFT-LCD关机横纹缺陷分析[J]. 液晶与显示, 2011,26(4): 464-468 DOI： 10.3788/YJYXS20112604.0464.

LU Lin-lin, XU Shuai. Analysis of Horizontal Block Stripe in TFT-LCD Panel in Switching-off Process[J]. , 2011,26(4): 464-468 DOI： 10.3788/YJYXS20112604.0464.

摘要

利用输出信号波形及偏压测试方法对TFT-LCD产品关机过程中发生的横纹不良进行了分析。分析结果表明

不良与像素电极放电效率相关。在此基础上提出了两种改善方法:一是通过改善TFT特性提高电极充放电能力;二是通过添加reset驱动电路实现像素电极同时放电。试验结果表明

放电效率的提升对于改善横纹缺陷效果明显

其中后者可完全消除不良现象。

Abstract

The horizontal block stripe

as an image quality defect

was analyzed by means of output signals and bias voltage stress (BVS) test. The results showed that the defect was correlated with discharging efficiency. Further

two approaches were proposed

one was to improve TFT characteristic

the other was to add reset function. The combined experiments indicated that discharging promotion can improve the defect. Especially the latter is most optimal to eliminate the phenomenon.

关键词

Keywords

references

Uchida T,Ishinable T. Progress of the high performance LCD[C]Proceedings of IDW08,Niigata,Japan:International Display Workshops,2008:1531-1534.[2] Hong Sunkwang,Oh Jaeho,Park Poyun,et al. Enhancement of motion image quality in LCDs[C] SID04 Symposium Digest,San Jose,USA:SID,2004:1353-1355.[3] De Ridder H. Image processing and the problem of quantifying image quality[C]ICIP 2001 Proceedings,Thessa-loniki,Greece:IEEE Signal Processing Society,2001:3-6.[4] Lin L,Liang B J. Charge-discharge identified time extension driving method[C]SID06 Symposium Digest,San Francisco,USA:SID,2006:370-373.[5] Miwa K,Maekawa Y,Tsujimura T. Vth shift overcompensation in AMOLEDs for differential aging compensation[C]SID09 Symposium Digest,Texas,USA:SID,2009:1148-1151.

Views

下载量

CSCD

Alert me when the article has been cited

提交

Tools

Publicity Resources

No data

Related Author

No data

Related Institution

No data

AI问答

Address：No.3888 Dong Nanhu Road, Changchun, Jilin, China 130033 Postal code：130033
Tel：0431-86176059 Email：yjxs@ciomp.ac.cn
Technical support is provided by Beijing Founder electronics co., LTD 吉ICP备11002662号-17 京公网安备11010802024621
It is recommended to read the content of this site in Chrome&IE9+. Please switch to extreme mode in browser 360.
Cookies We use cookies to help provide and enhance our service and tailor content. By continuing, you agree to the use of cookies.

⁰