Evaluation of LCD Life

KONG Ling-jun; REN Li-jun

doi:10.3788/YJYXS20112602.0154

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Evaluation of LCD Life

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- Evaluation of LCD Life
- Chinese Journal of Liquid Crystals and Displays Vol. 26, Issue 2, Pages: 154-157(2011)
- 作者机构：
  
  1. 成都天马微电子有限公司质量部,四川成都 611730
  2. 天马微电子股份有限公司深圳事业部实验室,广东深圳 518118
- 作者简介：
- 基金信息：
- DOI：10.3788/YJYXS20112602.0154
  CLC： TN27
- Received：27 September 2010，
  
  Revised：02 November 2010，
  
  Published Online：06 April 2011，
  
  Published：06 April 2011
- 稿件说明：
移动端阅览
孔令军, 任立军. 液晶显示器寿命评估[J]. 液晶与显示, 2011,26(2): 154-157

KONG Ling-jun, REN Li-jun. Evaluation of LCD Life[J]. , 2011,26(2): 154-157
孔令军, 任立军. 液晶显示器寿命评估[J]. 液晶与显示, 2011,26(2): 154-157 DOI： 10.3788/YJYXS20112602.0154.

KONG Ling-jun, REN Li-jun. Evaluation of LCD Life[J]. , 2011,26(2): 154-157 DOI： 10.3788/YJYXS20112602.0154.

摘要

提出了一种液晶显示器寿命评估方法。介绍了加速寿命实验的基本原理和实验方法

并对加速模型进行推导

在进行分布验证的前提下进行寿命计算

通过加速状态下测试的产品寿命计算任意环境下的寿命

完成液晶显示器的寿命评估。

Abstract

An evaluation method of LCD life was proposed in this paper. The basic experiment principle of accelerated life and experiment method were introduced

and the acceleration model was derived. Under the premise of distribution verifying

the accelerated life was calculated

and the life under any environment could be obtained by which the life evaluation of LCD is completed.

关键词

Keywords

references

Amerasekera E A, Naim F N. Failure Mechanisms and Models for Semiconductor Devices [M].USA:JEDEC Publication, 2009:39.[2] MIL-HAND-338B. Military handbook-electronic reliability design handbook [S]. USA: USA Department of Defendence, 1998:5-7,5-22,23.[3] 张建平.威布尔分布下VFD恒定应力加速寿命试验与统计分析 [J]. 液晶与显示, 2010,25(2):205-210.[4] 宋宇红,何林桥,杨顺林. 液晶显示器件电极腐蚀失效可靠性研究 [J]. 液晶与显示, 2009,24(3):459-463.[5] 刘明治. 可靠性试验 [M].北京:电子工业出版社,2004:57-83.

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Related Institution

School of Thermal Power and Environmental Engineering, Shanghai University of Electric Power

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Key Laboratory of Advanced Display and System Applications of EMC, Shanghai University

Chinese Academy of Sciences, Shanghai Institute of Ceramics

School of Thermal Power and Environmental Engineering, Shanghai University of Electric Power, Shanghai 200090, China,E-mail:jpzhanglzu@163.

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