Optoelectronic Device I-V Testing System Based on LabVIEW

YANG Yong; WANG Li-juan; CHEN Jin-xing; JIA Mei-chao; SHI Zhong-yu

doi:10.3788/YJYXS20112601.0059

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Optoelectronic Device I-V Testing System Based on LabVIEW

Device Technology & Physics | 更新时间：2020-08-12

- Optoelectronic Device I-V Testing System Based on LabVIEW
- Chinese Journal of Liquid Crystals and Displays Vol. 26, Issue 1, Pages: 59-63(2011)
- 作者机构：
  
  长春理工大学理学院,吉林长春,130022
- 作者简介：
- 基金信息：
- DOI：10.3788/YJYXS20112601.0059
  CLC： TM615
- Received：01 July 2010，
  
  Revised：02 August 2010，
  
  Published Online：20 February 2011，
  
  Published：20 February 2011
- 稿件说明：
移动端阅览
杨勇, 王丽娟, 陈金星, 贾昧超, 石中玉. 基于LabVIEW的光电器件I-V测试系统[J]. 液晶与显示, 2011,26(1): 59-63

YANG Yong, WANG Li-juan, CHEN Jin-xing, JIA Mei-chao, SHI Zhong-yu. Optoelectronic Device I-V Testing System Based on LabVIEW[J]. , 2011,26(1): 59-63
杨勇, 王丽娟, 陈金星, 贾昧超, 石中玉. 基于LabVIEW的光电器件I-V测试系统[J]. 液晶与显示, 2011,26(1): 59-63 DOI： 10.3788/YJYXS20112601.0059.

YANG Yong, WANG Li-juan, CHEN Jin-xing, JIA Mei-chao, SHI Zhong-yu. Optoelectronic Device I-V Testing System Based on LabVIEW[J]. , 2011,26(1): 59-63 DOI： 10.3788/YJYXS20112601.0059.

摘要

基于虚拟仪器技术

利用美国国家仪器(NI)公司的PCI-GPIB卡、LabVIEW软件和美国Keithley公司的6517静电计/高阻计等设备

建立了一套光电器件(太阳能电池、薄膜晶体管等)电流电压(

I-V

)特性测试平台

对光电器件的性能参数进行测试。该套测试系统通过LabVIEW程序控制Keithley6517

并通过GPIB卡实现对电压、电流数据的采集、显示、存储、分析等功能

根据测得的数据绘制出

I-V

特性曲线

根据不同的器件可以给出相应参数。以太阳能电池为例

计算出了太阳能电池的开路电压(

)、短路电流(

)、最大功率(

)、填充因子(FF)和转换效率(PCE)。校正对比测试结果表明

该系统效率的最大误差为0.18%。

Abstract

An optoelectronic device current-voltage (

I-V

) testing platform was established based on the software LabVIEW

including a PCI-GPIB card from American National Instrument (NI) Corporation as well as 6517 Electrometer/High Resistance Meter from Keithley Corporation. Using the LabVIEW program to control Keithley6517

the system has the function of collecting

displaying

storing and analyzing the voltage and current data through the GPIB card. It can also draw the

I-V

characteristic curve according to the measured data and figure out the relevant parameters of different devices.In this paper

taking solar cell as an example

it figures out the open voltage (

)

short current (

)

maximum power (

)

fill factor (FF) and percentage of conversion efficiency (PCE) of the solar cell. Through contrast test and correction

this system has a maximum error of 0.18%. This system not only has a high degree of automation

but also has a high degree of accuracy and reliability. And it not only can be used in laboratory teaching

also can be used in the factory for solar cell and thin film transistor products performance testing.

关键词

Keywords

references

狄大卫,高兆利,韩见珠,等. 应用光伏学 [M].上海:上海交通大学出版社,27:26-32.[2] 张重雄. 虚拟仪器技术分析与设计 [M].北京:电子工业出版社,27:47-56.[3] 刘恩科. 光电池及其应用 [M].北京:科学出版社,1991:24-28.[4] National Instrument. LabVIEW User Manual . .http://digital.ni.com/manuls.nsf/websearch/B24A54B2411CF9FC86256E45C673.[5] 赵秀田. 太阳能电池伏安特性测试装置的设计 [J]. 中国建设动态:阳光能源 ,25,1(12):4-42.[6] National Instruments. Getting Started with LabVIEW . .http://zone.ni.com/devzone/cda/tut/p/id/7466.[7] National Instruments. LabVIEW Measurements Manual . .http://digital.ni.com/manuals.nsf/websearch/9D3D53113B7875F86256D2C61F6BE.[8] 陈锡辉,张银鸿. LabVIEW8.2程序设计从入门到精通 [M].北京:清华大学出版社,27:87-89.

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