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Insulator defect detection based on improved YOLOv11n
Image Processing | 更新时间：2026-06-12

    • Insulator defect detection based on improved YOLOv11n

    • Chinese Journal of Liquid Crystals and Displays   Vol. 41, Issue 5, Pages: 687-699(2026)

    • DOI：10.37188/CJLCD.2026-0053    

      CLC： TM85;TP391.41
    • CSTR：32172.14.CJLCD.2026-0053    

    • Received：27 March 2026，

      Revised：2026-04-12，

      Published：05 May 2026

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  • LEI Dewei, LIN Guojun, MA Run, et al. Insulator defect detection based on improved YOLOv11n[J]. Chinese Journal of Liquid Crystals and Displays, 2026, 41(5): 687-699. DOI： 10.37188/CJLCD.2026-0053. CSTR： 32172.14.CJLCD.2026-0053.

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