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Weak feature defect detection method for LCD screens based on YOLOv5
Image Processing | 更新时间：2024-06-27
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    • Weak feature defect detection method for LCD screens based on YOLOv5

    • “In the field of LCD display defect detection, researchers have proposed an improved YOLO Mura model, which significantly improves the detection accuracy and computational efficiency of weak feature defects by introducing the Involution operator, CARAFE upsampling operator, BiFormer attention module, and BiFPN weighted bidirectional pyramid structure.”
    • Chinese Journal of Liquid Crystals and Displays   Vol. 39, Issue 6, Pages: 790-800(2024)

    • DOI：10.37188/CJLCD.2023-0206    

      CLC： TP391.41

    • Received：06 June 2023，

      Revised：02 July 2023，

      Published：05 June 2024

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  • LIN Feng, SHI Yan, CHEN Shunlong, et al. Weak feature defect detection method for LCD screens based on YOLOv5[J]. Chinese journal of liquid crystals and displays, 2024, 39(6): 790-800. DOI： 10.37188/CJLCD.2023-0206.

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