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Weak feature defect detection method for LCD screens based on YOLOv5
Image Processing | 更新时间：2024-06-27
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    • Weak feature defect detection method for LCD screens based on YOLOv5

    • “在液晶屏显示缺陷检测领域，研究者提出了YOLO-Mura改进模型，通过引入Involution算子、CARAFE上采样算子、BiFormer注意力模块和BiFPN加权双向金字塔结构，显著提升了微弱特征缺陷的检测精度和计算效率。”
      ”
    • Chinese Journal of Liquid Crystals and Displays   Vol. 39, Issue 6, Pages: 790-800(2024)

    • DOI：10.37188/CJLCD.2023-0206    

      CLC： TP391.41

    • Published：05 June 2024，

      Received：06 June 2023，

      Revised：02 July 2023，

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  • LIN Feng, SHI Yan, CHEN Shunlong, et al. Weak feature defect detection method for LCD screens based on YOLOv5. [J]. Chinese Journal of Liquid Crystals and Displays 39(6):790-800(2024) DOI： 10.37188/CJLCD.2023-0206.

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LIN Feng
SHI Yan
CHEN Shun-long
LIAO Ying-hua
ZHAO Lian
ZHAO Li
ZHOU Ze-min

Related Institution

School of Mechanical Engineering， Sichuan University of Light and Chemical Technology
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