Quantitative study on the mechanism of high temperature vertical crosstalks

Jun LIU; Da-yu ZHAO; Peng CHEN; Hui-bing GUO; Yu-jie GAO

doi:10.37188/CJLCD.2021-0021

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Quantitative study on the mechanism of high temperature vertical crosstalks

Display Technology and Applications | 更新时间：2021-08-05

- Quantitative study on the mechanism of high temperature vertical crosstalks
- Chinese Journal of Liquid Crystals and Displays Vol. 36, Issue 8, Pages: 1128-1135(2021)
- 作者机构：
  
  武汉京东方光电科技有限公司, 湖北武汉 430000
- 作者简介：
- 基金信息：
- DOI：10.37188/CJLCD.2021-0021
  CLC： TN141.9
- Received：09 March 2021，
  
  Revised：24 March 2021，
  
  Published：2021-08
- 稿件说明：
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Jun LIU, Da-yu ZHAO, Peng CHEN, et al. Quantitative study on the mechanism of high temperature vertical crosstalks[J]. Chinese journal of liquid crystals and displays, 2021, 36(8): 1128-1135.
DOI：

Jun LIU, Da-yu ZHAO, Peng CHEN, et al. Quantitative study on the mechanism of high temperature vertical crosstalks[J]. Chinese journal of liquid crystals and displays, 2021, 36(8): 1128-1135. DOI： 10.37188/CJLCD.2021-0021.

摘要

为快速解决大尺寸薄膜晶体管液晶显示器（TFT-LCD）产品中的高温竖向串扰（V-CT）不良，本文研究了漏电流与V-CT现象间的定量关系，用以指导TFT特性相关工艺的调整。首先，基于V-CT电压梯度曲线及TFT开关实际工作状态下的漏电流，建立了一种定量表征漏电流的大小和V-CT严重程度间关系的测试方法。然后，应用此方法对客户端评测画面（CT-SEC）下发生的高温V-CT进行研究，实验结果表明：V-CT电压梯度曲线可以较好地匹配总体漏电流

off_total

渐变规律。高温初始及长期信赖性评价条件下，V-CT不良的发生同显示面板面内的光照漏电流

off

（

gl_GOUT

pixel_255-

）强相关。

Abstract

In order to solve the problem of high temperature vertical crosstalk in large size thin film transistor liquid crystal display (TFT-LCD) quickly

the quantitative relationship between leakage current and V-CT phenomenon was studied to provide guidance of the process adjustment of TFT characteristics. Firstly

based on the contour map of

gl_TCON

characterized the occurrence of V-CT and the leakage current of TFT in actual working state

a method was developed to characterize the relationship between leakage current and severity of V-CT quantitatively. Secondly

according to the study of V-CT in CT-SEC image

the following conclusions are obtained: (1) the contour map and the trend of

off_total

match well in different

gl_TCON

value; (2) V-CT is strongly correlated with the leakage current under the photo

off

(

gl_GOUT

pixel_255-

) over any period in high temperature.

关键词

Keywords

references

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Related Institution

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