Influence factors of pressing repair for particle gap

Lei YIN; Ping CHEN; Chuan FENG; Hai-bin HAN; Na-na LI; Tao LIU; Chen TANG

doi:10.37188/CJLCD.2020-0240

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Influence factors of pressing repair for particle gap

Display Technologyand Applications | 更新时间：2021-04-28

- Influence factors of pressing repair for particle gap
- Chinese Journal of Liquid Crystals and Displays Vol. 36, Issue 5, Pages: 699-704(2021)
- 作者机构：
  
  合肥京东方光电科技有限公司, 安徽合肥 230012
- 作者简介：
- 基金信息：
- DOI：10.37188/CJLCD.2020-0240
  CLC： TN873.93
- Received：14 September 2020，
  
  Revised：03 January 2021，
  
  Published：2021-05
- 稿件说明：
移动端阅览
Lei YIN, Ping CHEN, Chuan FENG, et al. Influence factors of pressing repair for particle gap[J]. Chinese journal of liquid crystals and displays, 2021, 36(5): 699-704.
DOI：

Lei YIN, Ping CHEN, Chuan FENG, et al. Influence factors of pressing repair for particle gap[J]. Chinese journal of liquid crystals and displays, 2021, 36(5): 699-704. DOI： 10.37188/CJLCD.2020-0240.

摘要

根据异物晕不良形成原因及修复方法，分析了成盒盒厚及压头直径对不良修复成功率的影响因素。当面板盒厚大小不同时，在相同压力值下修复成功率存在差异，不同盒厚产品对应的修复最佳压力值大小并不相同。面板盒厚越小达到最佳修复效果所需的压力值越大，反之亦然。压头直径的变化直接影响作用在基板表面的压强，随着压强增加，修复成功率先增后减，碎屏率在一定压强后显著增加。研究表明，在实际生产中对异物晕不良进行按压修复时，需针对不同型号的产品盒厚找出合适的压力，并通过达到最佳效果所需的压强找出合适的压头，以保障良好的修复效果。

Abstract

Based on the causes and repair methods of particle gap

this paper analyzes the influence factors about the cell gap and head diameter for success rate. When the cell gap is different

the same pressure value has different success rate. The different cell gap has the differentiation of the optimal pressure value. When the cell gap is small

the pressure value required to achieve the best repair effect is larger

and

vice versa.

The change in the diameter of head directly affects the intensity of pressure acting on the TFT-LCD surface. With the intensity of pressure increasing

the success rate first increases and then decreases. The broken screen rate increases significantly after a certain pressure. The study shows that in order to ensure the repair effect of pressing particle gap in actual production

it is necessary to adjust the appropriate pressure for the different cell gap

and through the best intensity of pressure to select the appropriate diameter of head

to ensure a good repair effect.

关键词

Keywords

references

韩磊 , 魏平玉 , 周春霖 , 等 . 晕开不良修复方法及影响因素的研究 . 液晶与显示 , 2017 . 32 ( 2 ): 110 - 116 . http://cjlcd.lightpublishing.cn/thesisDetails#10.3788/YJYXS20173202.0110 http://cjlcd.lightpublishing.cn/thesisDetails#10.3788/YJYXS20173202.0110 .

L HAN , P Y WEI , C L ZHOU , 等 . Particle gap repair method and effect actors analysis . Chinese Journal of Liquid Crystals and Displays , 2017 . 32 ( 2 ): 110 - 116 . http://cjlcd.lightpublishing.cn/thesisDetails#10.3788/YJYXS20173202.0110 http://cjlcd.lightpublishing.cn/thesisDetails#10.3788/YJYXS20173202.0110 .

黄雅纹 , 陈再良 . T FT LCD常见点缺陷的检测与修复 . 现代电子技术 , 2012 . 35 ( 23 ): 189 - 191 . DOI: 10.3969/j.issn.1004-373X.2012.23.057 http://doi.org/10.3969/j.issn.1004-373X.2012.23.057 .

Y W HUANG , Z L CHEN . Detection and repair of point defects in TFT LCD . Modern Electronics Technique , 2012 . 35 ( 23 ): 189 - 191 . DOI: 10.3969/j.issn.1004-373X.2012.23.057 http://doi.org/10.3969/j.issn.1004-373X.2012.23.057 .

王海成 , 董天松 , 马亮 , 等 . TFT-LCD制程中成盒工艺段常见不良浅析 . 电子世界 , 2018 . ( 23 ): 12 - 15 . https://www.cnki.com.cn/Article/CJFDTOTAL-ELEW201823012.htm https://www.cnki.com.cn/Article/CJFDTOTAL-ELEW201823012.htm .

H C WANG , T S DONG , L MA , 等 . Analysis of common defects in box-forming process in TFT-LCD process . Electronics World , 2018 . ( 23 ): 12 - 15 . https://www.cnki.com.cn/Article/CJFDTOTAL-ELEW201823012.htm https://www.cnki.com.cn/Article/CJFDTOTAL-ELEW201823012.htm .

吴涛, 钮曼萍. 液晶显示面板的修复方法: 中国, CN102654661A[P]. 2012-09-05.

WU T, NIU M P. Repairing method of liquid crystal display panel: CN, CN102654661A[P]. 2012-09-05. (in Chinese).

邱永亮 , 李荣玉 , 顾筠筠 . TFT-LCD制造过程中的盒厚控制工艺研究 . 现代显示 , 2008 . ( 6 ): 33 - 35, 58 . https://www.cnki.com.cn/Article/CJFDTOTAL-XDYS200806011.htm https://www.cnki.com.cn/Article/CJFDTOTAL-XDYS200806011.htm .

Y L QIU , R Y LI , Y Y GU . LCD's gap control in TFT-LCD production . Advanced Display , 2008 . ( 6 ): 33 - 35, 58 . https://www.cnki.com.cn/Article/CJFDTOTAL-XDYS200806011.htm https://www.cnki.com.cn/Article/CJFDTOTAL-XDYS200806011.htm .

黎关超 , 王超 , 何伟 , 等 . TFT-LCD行业异物不良改善研究 . 液晶与显示 , 2017 . 32 ( 10 ): 787 - 793 . http://cjlcd.lightpublishing.cn/thesisDetails#10.3788/YJYXS20173210.0787 http://cjlcd.lightpublishing.cn/thesisDetails#10.3788/YJYXS20173210.0787 .

G C LI , C WANG , W HE , 等 . Research and improvement of particle defect in TFT-LCD industry . Chinese Journal of Liquid Crystals and Displays , 2017 . 32 ( 10 ): 787 - 793 . http://cjlcd.lightpublishing.cn/thesisDetails#10.3788/YJYXS20173210.0787 http://cjlcd.lightpublishing.cn/thesisDetails#10.3788/YJYXS20173210.0787 .

魏平玉, 韩磊, 郭栋, 等. 金属线的修复设备: 中国, CN204215119U[P]. 2015-03-18.

WEI P Y, HAN L, GUO D, et al . Metal wire repair equipment: CN, CN204215119U[P]. 2015-03-18. (in Chinese)

张明亮 , 黎海波 , 丁甲 , 等 . TFT-LCD工艺中Gap性不良的分析与改善 . 电子世界 , 2017 . ( 19 ): 64 - 66 . https://www.cnki.com.cn/Article/CJFDTOTAL-ELEW201719037.htm https://www.cnki.com.cn/Article/CJFDTOTAL-ELEW201719037.htm .

M L ZHANG , H B LI , J DING , 等 . Analysis and improvement of gap defects in TFT-LCD process . Electronics World , 2017 . ( 19 ): 64 - 66 . https://www.cnki.com.cn/Article/CJFDTOTAL-ELEW201719037.htm https://www.cnki.com.cn/Article/CJFDTOTAL-ELEW201719037.htm .

马宝平 , 陈再良 . LCD常见点缺陷的修复 . 苏州大学学报(工科版) , 2009 . 29 ( 4 ): 70 - 72 . https://www.cnki.com.cn/Article/CJFDTOTAL-SILK200904017.htm https://www.cnki.com.cn/Article/CJFDTOTAL-SILK200904017.htm .

B P MA , Z L CHEN . LCD point defect repair . Journal of Suzhou University (Engineering Science Edition) , 2009 . 29 ( 4 ): 70 - 72 . https://www.cnki.com.cn/Article/CJFDTOTAL-SILK200904017.htm https://www.cnki.com.cn/Article/CJFDTOTAL-SILK200904017.htm .

马群刚 . TFT-LCD原理与设计 , : 北京电子工业出版社 , 2011 .

Q G MA . TFT-LCD Principle and Design , : Beijing Publishing House of Electronics Industry , 2011 .

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