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Fixed pattern noise correction of CMOS image sensor based on dark current
Image Processing | 更新时间:2021-02-07
    • Fixed pattern noise correction of CMOS image sensor based on dark current

    • Chinese Journal of Liquid Crystals and Displays   Vol. 36, Issue 2, Pages: 327-333(2021)
    • DOI:10.37188/CJLCD.2020-0176    

      CLC: TN492
    • Received:07 July 2020,

      Revised:16 September 2020,

      Accepted:16 September 2020,

      Published:2021-02

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  • Qiang LI, Long-xu JIN, Guo-ning LI. Fixed pattern noise correction of CMOS image sensor based on dark current[J]. Chinese journal of liquid crystals and displays, 2021, 36(2): 327-333. DOI: 10.37188/CJLCD.2020-0176.

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