Color filter partition inspection and judgment of automatic optical inspection

ZHANG Tie-yi; YU Dao-ping; WANG Ye; LIU Chao-qiang; ZHANG Xiang

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Color filter partition inspection and judgment of automatic optical inspection

Device Physics & Device Technology | 更新时间：2020-08-12

- Color filter partition inspection and judgment of automatic optical inspection
- Chinese Journal of Liquid Crystals and Displays Vol. 29, Issue 1, Pages: 34-39(2014)
- 作者机构：
  
  北京京东方显示技术有限公司北京,中国,100176
- 作者简介：
- 基金信息：
- DOI：
  CLC： TH865;TH691.9
- Received：22 January 2013，
  
  Revised：27 March 2013，
  
  Published：15 February 2014
- 稿件说明：
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张铁轶, 余道平, 王野, 刘超强, 张祥. 自动光学检测的彩膜分区检查与判定[J]. 液晶与显示, 2014,29(1): 34-39

ZHANG Tie-yi, YU Dao-ping, WANG Ye, LIU Chao-qiang, ZHANG Xiang. Color filter partition inspection and judgment of automatic optical inspection[J]. , 2014,29(1): 34-39
张铁轶, 余道平, 王野, 刘超强, 张祥. 自动光学检测的彩膜分区检查与判定[J]. 液晶与显示, 2014,29(1): 34-39 DOI：

ZHANG Tie-yi, YU Dao-ping, WANG Ye, LIU Chao-qiang, ZHANG Xiang. Color filter partition inspection and judgment of automatic optical inspection[J]. , 2014,29(1): 34-39 DOI：

摘要

为了提高自动光学检测系统检测彩膜质量的准确率，降低误判，通过分析由红绿蓝三色组成矩阵结构和Line CCD获取的彩膜图像特征，在五点周期比较检测的基础上设计一种彩膜缺陷的检测方法。该方法通过对彩膜的机械与光学对位后，通过五点比对进行缺陷的检测。Line CCD从红绿蓝3个不同的区域获取不同的灰阶值，分别设置3个区域的灰阶值范围和该区域的判定阈值；最后根据缺陷与正常点灰阶差值的不同对缺陷进行分类，赋予相应的缺陷代码。基于以上3个步骤，实现对整张彩膜的缺陷检测。实验结果表明，采用五点比较、分区检测和缺陷分类相结合的方法，缺陷检出的准确率可以提高至99.6%以上。

Abstract

In order to improve the inspection accuracy and reduce misjudgment rate for the color filter quality inspection in an automatic optical inspection system

a defect inspection method for color filter was proposed based on analyzing the color filter image acquired by the red

green and blue color matrix structure and Line CCD. Three steps were used to detect the defect of color filter. Defects of color filter were inspected firstly by the five points comparison method after mechanical and optical alignment for color filter.Then

according to Line CCD obtained by three different grayscale values from the red

green and blue area

the determination threshold are respectively provided in the three regions. Finally

the defects were classified depending on the grayscale difference in the defect and the normal point

and the corresponding defect code is given. The experiment results show that the proposed method composed of the five points comparison method

partition detection

defect classification can make inspection accuracy reach more than 99.6%.

关键词

Keywords

references

田民波, 叶锋.TFT液晶显示原理与技术[M].北京:科技出版社, 2010:263-276. Tian M B, Ye F.TFT Liquid Crystal Display Principle and Technology[M].Beijing: Publishing House of Science and Technology, 2010:263-276.(in Chinese)[2] 蒲亮, 叶玉堂. 基于优化K-D树的大面积高密度PCB快速AOI[J]. 仪器仪表学报, 2011, 32(4):955-259. Pu L, Ye Y T.Large area optimized K-D tree of high density PCB based fast AOI[J]. Chinese Journal of Scientific Instrument, 2011, 32(4):955-259.(in Chinese)[3] 江亿, 李元哲, 狄洪发. 关于透过体系透过率计算方法的探讨[J]. 太阳能学报, 1980, 2(1):167-175. Jiang Y, Li Y ZH, Di H F. Discussion on through the system through the ratio calculation method[J]. Journal of Solar Energy, 1980, 2(1):167-175.(in Chinese)[4] 何滢, 曲兴华. 非金属工件电镀表面缺陷现场检测技术的研究[J]. 仪器仪表学报, 2004, 25(2):271-273. He Y, Qu X H.Detection of surface defects of nonmetal workpieces site[J]. Chinese Journal of Scientific Instrument, 2004, 25(2):271-273.(in Chinese)[5] 李丙玉, 王晓东, 李哲. 在轨完成CCD非均匀性校正的方法[J]. 液晶与显示, 2011, 26(2):255-259. Li B Y, Wang X D, Li Z.Completion of in-orbit CCD non-uniformity correction method[J].Chinese Journal of Liquid Crystals and Displays, 2011, 26(2):255-259.(in Chinese)[6] 王运, 颜昌翔. 光谱仪图像的亚像素配准[J]. 光学精密工程, 2012, 20(3):661-666. Wang Y, Yan C X.Subpixel registration of spectrometer image[J]. Optics and Precision Engineering, 2012, 20(3):661-666.(in Chinese)[7] 刘妍妍, 李国宁, 张瑜. 可见光面阵CCD相应非均匀性的检测与校正[J]. 液晶与显示, 2010, 25(5):759-763. Liu Y Y, Li G N, Zhang Y.Visible area CCD non-uniformity of the corresponding detection and correction[J].Chinese Journal of Liquid Crystals and Displays, 2010, 25(5):759-763.(in Chinese)[8] Tae-Hyoung P, Hwa-Jung K, Nam K.Path planning of automated optical inspection machines for PCB assembly systems[J].International Journal of Control, Automation, and Systems, 2006, 4(1):96-104.[9] 沈湘衡, 杨亮, 贺庚贤. 光电测量设备光学系统的像面照度均匀性检测[J]. 光学精密工程, 2008, 16(12):2531-2536. Shen X H, Yang L, He G X.Image plane illuminance uniformity detects of optical measuring apparatus's optical system[J]. Optics and Precision Engineering, 2008, 16(12):2531-2536.(in Chinese)[10] 乔闹生, 叶玉堂. PCB光电图像光照不均蜕化的校正及阈值分割方法[J]. 光子学报, 2009, 38(11):3000-3003. Qiao N SH, Ye Y T.PCB optical image uneven illumination degenerate's correction and thresholding method[J].Acta Photonica Sinica, 2009, 38(11):3000-3003.(in Chinese)[11] 邱文涛, 赵建, 刘杰. 结合区域分割的SIFE图像匹配方法[J]. 液晶与显示, 2012, 627(6):827-831. Qiu W T, Zhao J, Liu J.Matching method of the SIFE image combined with segmentation[J].Chinese Journal of Liquid Crystals and Displays, 2012, 627(6):827-831.(in Chinese)

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Related Institution

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R&D Center， TCL Electronics Holdings Limited

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National & Local United Engineer Laboratory of Flat Panel Display Technology, College of Physics and Information Engineering, Fuzhou University

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