Constant Stress Accelerated Life Test of White OLED Based on MAM

ZHANG Jian-ping; LIU Yu; CHENG Guo-liang; ZHU Wen-qing; LIU Fang

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Constant Stress Accelerated Life Test of White OLED Based on MAM

Device Physics & Device Technology | 更新时间：2020-08-12

- Constant Stress Accelerated Life Test of White OLED Based on MAM
- Chinese Journal of Liquid Crystals and Displays Vol. 27, Issue 1, Pages: 61-65(2012)
- 作者机构：
  
  1. 上海电力学院能源与环境工程学院上海,200090
  2. 中国科学院上海硅酸盐研究所上海,200050
  3. 上海天逸电器有限公司,上海 201611
  4. 上海大学新型显示技术及应用集成教育部重点实验室,上海 200072
- 作者简介：
- 基金信息：
- DOI：
  CLC： TN383+.1;TN873+.3
- Received：10 September 2011，
  
  Revised：12 October 2011，
  
  Published Online：15 February 2012，
  
  Published：15 February 2012
- 稿件说明：
移动端阅览
张建平, 刘宇, 成国梁, 朱文清, 刘芳. 基于MAM的白光OLED恒定应力加速寿命试验研究[J]. 液晶与显示, 2012,27(1): 61-65

ZHANG Jian-ping, LIU Yu, CHENG Guo-liang, ZHU Wen-qing, LIU Fang. Constant Stress Accelerated Life Test of White OLED Based on MAM[J]. , 2012,27(1): 61-65
张建平, 刘宇, 成国梁, 朱文清, 刘芳. 基于MAM的白光OLED恒定应力加速寿命试验研究[J]. 液晶与显示, 2012,27(1): 61-65 DOI：

ZHANG Jian-ping, LIU Yu, CHENG Guo-liang, ZHU Wen-qing, LIU Fang. Constant Stress Accelerated Life Test of White OLED Based on MAM[J]. , 2012,27(1): 61-65 DOI：

摘要

为了短时间内获得白光有机发光显示器(OLED)的可靠性寿命信息

通过对其开展三组恒定电流应力加速寿命试验采集样品失效试验数据

应用对数正态分布函数描述白光OLED的寿命分布。在图分析法(MAM)的基础上

基于自行开发的寿命预测软件

绘制了对数正态概率双坐标纸

计算出白光OLED的平均寿命和中位寿命。数值结果表明

白光OLED寿命服从对数正态分布

加速寿命方程符合逆幂定律

精确计算的加速参数使得对其寿命的快速估算成为可能。结果可为生产厂商和用户提供参考和指导。

Abstract

In order to obtain the reliability life information of the white Organic Light-Emitting Diode (OLED) in a short time

failure data of OLED samples were collected by carrying out three groups of constant current stress accelerated life tests

and the lognormal distribution function was applied to describing the life distribution. The evolution of OLED's average life and the median life were achieved by applying the lognormal distribution to describing the life

and the self-developed life prediction software to plotting double coordinates' paper of lognormal probability

which based on map analysis method (MAM). Numerical results indicate that white OLED's life follows the lognormal distribution

that the acceleration model is consistent with inverse power law

and that the acceleration parameters which are accurately calculated make fast estimation of white OLED lifetime possible

which provides some significant guideline to its manufacturers and customers.

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Keywords

references

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Related Institution

QM Department, Chengdu Tianma Micro-Electronics Co. Ltd.

Quality Department Lab, ShenZhen Tianma Micro-Electronics Co. Ltd.

School of Thermal Power and Environmental Engineering, Shanghai University of Electric Power, Shanghai 200090, China,E-mail:jpzhanglzu@163.

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