Constant-Step Stress Accelerated Life Tests of White OLED by BRM

ZHANG Jian-ping; WU Liang; CHENG Guo-liang; ZHOU Ting-jun; ZHU Wen-qing

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Constant-Step Stress Accelerated Life Tests of White OLED by BRM

Table of contents | 更新时间：2020-08-12

- Constant-Step Stress Accelerated Life Tests of White OLED by BRM
- Chinese Journal of Liquid Crystals and Displays Vol. 27, Issue 2, Pages: 187-192(2012)
- 作者机构：
  
  1. 上海电力学院能源与环境工程学院上海,200090
  2. 上海天逸电器有限公司上海,201611
  3. 上海大学新型显示技术及应用集成教育部重点实验室上海,200072
- 作者简介：
- 基金信息：
- DOI：
  CLC： TN873+.3
- Received：08 November 2011，
  
  Revised：24 November 2011，
  
  Published Online：15 April 2012，
  
  Published：15 April 2012
- 稿件说明：
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张建平, 吴亮, 成国梁, 周廷君, 朱文清. 基于BRM的白光OLED恒定与步进应力加速寿命试验研究[J]. 液晶与显示, 2012,(2): 187-192

ZHANG Jian-ping, WU Liang, CHENG Guo-liang, ZHOU Ting-jun, ZHU Wen-qing. Constant-Step Stress Accelerated Life Tests of White OLED by BRM[J]. , 2012,(2): 187-192
张建平, 吴亮, 成国梁, 周廷君, 朱文清. 基于BRM的白光OLED恒定与步进应力加速寿命试验研究[J]. 液晶与显示, 2012,(2): 187-192 DOI：

ZHANG Jian-ping, WU Liang, CHENG Guo-liang, ZHOU Ting-jun, ZHU Wen-qing. Constant-Step Stress Accelerated Life Tests of White OLED by BRM[J]. , 2012,(2): 187-192 DOI：

摘要

为了获得白光OLED的寿命信息

通过加大电流应力开展了二组恒定和一组步进应力相组合的加速寿命试验。采用威布尔函数描述白光OLED的寿命分布

利用双线性回归法(BRM)估计出威布尔参数

确定了加速寿命方程

对白光OLED寿命是否符合威布尔分布进行了Kolmogorov-Smirnov检验

并利用自行开发的寿命预测软件计算出平均寿命和中位寿命。数值结果表明

恒定步进应力加速寿命试验方案是切实可行的

白光OLED的寿命服从威布尔分布

寿命应力关系满足线性Arrhenius方程

精确计算的加速参数可实现在短时间内OLED寿命的预测。

Abstract

In order to acquire the life information of white OLED

two constant and one step stress accelerated life tests (ALT) were conducted with current stress increased. Weibull Distribution function was applied to describing the life distribution

Bilinear Regression Method (BRM) was employed to estimate the Weibull parameters

and the accelerated life equation was determined. The Kolmogorov-Smirnov test was performed to verify whether the White OLED life met the Weibull distribution or not

and the software developed by authors was used to calculate the average life and median life. The numerical results indicate that the test plans of constant-step ALT are feasible and versatile

that the OLED life follows the Weibull distribution

and that the life-stress relationship satisfies linear Arrhenius equation completely. The precise accelerated parameter is shown to be particularly useful to predict the OLED life within shorter time.

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Keywords

references

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