WANG Liang, WANG Wen-qing, LI Xin, WU Cheng-long, ZHENG Yun-you, SONG Yong-zhen, LI Wei, LI Zheng-xun. Effects of PR Ashing in Process of Enhanced Capacitive Coupled Plasma Etch[J]. , 2012,(2): 204-207
WANG Liang, WANG Wen-qing, LI Xin, WU Cheng-long, ZHENG Yun-you, SONG Yong-zhen, LI Wei, LI Zheng-xun. Effects of PR Ashing in Process of Enhanced Capacitive Coupled Plasma Etch[J]. , 2012,(2): 204-207DOI:
Effects of PR Ashing in Process of Enhanced Capacitive Coupled Plasma Etch
ratio were researched in process of ECCP dry etch model when the gas flow rate and pressure changed. The results show that PR ashing rate and the value of
H/V
would enlarge with the increasing pressure in a certain range. At the same time the uniformity also gradually changed for the better. The ashing rate would first increase and then decrease when the SF
6
flow rate increased. But in this time the value of
H/V
had one contrary law. The PR ashing rate did not change significantly but the value of uniformity became smaller gradually when increased the O
2
flow rate only. When the flow rate of SF
6
and O
2
increased but had one constant low proportion
the etching rate of PR increased first and then decreased