您当前的位置:
首页 >
文章列表页 >
Effects of PR Ashing in Process of Enhanced Capacitive Coupled Plasma Etch
更新时间:2020-08-12
    • Effects of PR Ashing in Process of Enhanced Capacitive Coupled Plasma Etch

    • Chinese Journal of Liquid Crystals and Displays   Vol. 27, Issue 2, Pages: 204-207(2012)
    • Received:13 December 2011,

      Revised:10 January 2012,

      Published Online:15 April 2012,

      Published:15 April 2012

    移动端阅览

  • WANG Liang, WANG Wen-qing, LI Xin, WU Cheng-long, ZHENG Yun-you, SONG Yong-zhen, LI Wei, LI Zheng-xun. Effects of PR Ashing in Process of Enhanced Capacitive Coupled Plasma Etch[J]. , 2012,(2): 204-207 DOI:

  •  
  •  

0

Views

194

下载量

6

CSCD

Alert me when the article has been cited
提交
Tools
Download
Export Citation
Share
Add to favorites
Add to my album

Related Articles

Process optimization based on products of pixel top design
Role of BCl3 gas in Ti/Al/Ti dry etching process
Improvement of photoresist abnormal degeneration in inductively coupled plasma etch
Influence of different dry etching process of contact hole on TFT-LCD performance
Improvement of flicker TFT-LCD by dry etching process

Related Author

Heng-bin LI
Xiang-wan LU
Zeng-li Liu
Yao-yao FENG
Yan-ming LYU
Bin-bin CAO
Fang-fang LI
Hui AN

Related Institution

HeFei XinSheng Optoelectronics Technology Co., Ltd.
Chong Qing BOE Display Technology Co., Ltd
HeFeiXinSheng Optoelectronics Technology Co., Ltd
Ordos Yuansheng Optoelectronics Co. Ltd.
Fuzhou BOE Optoelectronics Technology Co., Ltd
0