浏览全部资源
扫码关注微信
成都京东方光电科技有限公司3. 成都京东方光电科技股份有限公司
Received:04 August 2011,
Revised:17 November 2011,
Published Online:19 January 2012,
Published:06 April 2011
移动端阅览
甘波, 魏廷存, 郑然. CMOS图像传感器芯片的自动白平衡算法[J]. 液晶与显示, 2011,26(2): 224-228
GAN Bo, WEI Ting-cun, ZHENG Ran. Auto White Balance Algorithm for CMOS Image Sensor Chip[J]. , 2011,26(2): 224-228
甘波, 魏廷存, 郑然. CMOS图像传感器芯片的自动白平衡算法[J]. 液晶与显示, 2011,26(2): 224-228 DOI:
GAN Bo, WEI Ting-cun, ZHENG Ran. Auto White Balance Algorithm for CMOS Image Sensor Chip[J]. , 2011,26(2): 224-228 DOI:
研究了摩擦(Rubbing)强度对Zara漏光和Rubbing Mura的影响。实验表明,当Rubbing强度偏低时,Zara漏光易发生,而Rubbing强度偏高时,则易引发Rubbing Mura。通过选择合适的Rubbing强度,可降低Zara漏光和Rubbing Mura的发生率。另外,利用FIB对基板表面进行分析,找到了FFS型产品容易发生Zara漏光和Rubbing Mura的原因。
The dependence of Zara and Rubbing Mura on Rubbing intensity has been studied. The experimental result show that
when Rubbing intensity is low
Zara easily occurs
and Rubbing intensity is high
Rubbing Mura easily occurs. By selecting the right Rubbing intensity
can reduce the incidence Zara and Rubbing Mura. In addition
through use FIB to observe the surface of the substrate
we found the reason of FFS product prone to occur Zara and Rubbing Mura
刘永智,杨开愚.液晶显示技术[M].成都:电子科技大学出版社,2000:339-345[2] 王新久.液晶光学和液晶显示[M].北京:科学出版社,2006:239-245[3] 杨国波等.ODF 工艺进展[J].光机电信息,2011,28(1):23-27[4] 王大巍等著,薄膜晶体管液晶显示器件的制造、测试与技术发展[M].北京:机械出版社,2007:10-25
0
Views
106
下载量
CSCD
Publicity Resources
Related Articles
Related Author
Related Institution