Testing System for Aerial Camera Circuit Board Based on Virtual Instrument

WANG Feng; GAO Ya-fei; ZHOU Gang; WANG De-jiang

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Testing System for Aerial Camera Circuit Board Based on Virtual Instrument

Device Technology & Physics | 更新时间：2020-08-12

- Testing System for Aerial Camera Circuit Board Based on Virtual Instrument
- Chinese Journal of Liquid Crystals and Displays Vol. 25, Issue 5, Pages: 702-705(2010)
- 作者机构：
  
  1. 中国科学院长春光学精密机械与物理研究所, 吉林长春 130033
  2. 中国人民解放军驻一三三厂军事代表室,吉林长春 130052,E-mail:mqy228@163. com
- 作者简介：
- 基金信息：
- DOI：
  CLC： V44
- Received：07 April 2010，
  
  Revised：05 May 2010，
  
  Published Online：28 September 2010，
  
  Published：20 October 2010
- 稿件说明：
移动端阅览
王锋, 高亚飞, 周刚, 王德江. 基于虚拟仪器的航空相机电路板检测系统[J]. 液晶与显示, 2010,25(5): 702-705

WANG Feng, GAO Ya-fei, ZHOU Gang, WANG De-jiang. Testing System for Aerial Camera Circuit Board Based on Virtual Instrument[J]. 液晶与显示, 2010,25(5): 702-705
王锋, 高亚飞, 周刚, 王德江. 基于虚拟仪器的航空相机电路板检测系统[J]. 液晶与显示, 2010,25(5): 702-705 DOI：

WANG Feng, GAO Ya-fei, ZHOU Gang, WANG De-jiang. Testing System for Aerial Camera Circuit Board Based on Virtual Instrument[J]. 液晶与显示, 2010,25(5): 702-705 DOI：

摘要

介绍了某型航空相机电路板检测系统的设计方案。该方案将电控系统中需要检测的电路板上多个待测信号通过一个专用连接器引出

用不同电缆将不同规格检查口与检测设备连接

由检测设备负责选择待测信号

并通过虚拟仪器采集信号。将采集到的信号波形与检测设备预先存储的信号波形相比较可得知信号是否正常。使用该检测方法大大提高了对相机的检测效率。

Abstract

The design of a testing system of aerial camera circuit board is introduced. The tested signals on every circuit board come from a special connector. The different tested interface is connected to testing equipment through different cable. The signal is selected from the interface by testing equipment and acquired by virtual instrument. We can know whether the signal works well through comparing the acquiring wave with the pre-storage wave. This method improves the testing camera efficiency.

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references

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杨健,许路铁.秘文亮.基于虚拟仪器技术的电子设备测试系统

. 科学技术与工程, 2007,7(11):2697-2699.

Kruglinski D J, Wingo S, Shepherd G. Programming Visual C++ 6.0技术内幕

. 北京:北京希望电子出版社,2000.

周刚,翟林培,王德江,等.全景式航空相机的扫描角研究

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张树青,丁亚林,于春风.凝视模式下的画幅相机两轴像移补偿

. 光学精密工程, 2007,15(11):1789-1795.

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