N &amp; K Analyzer in OLED Failure Analysis

CHEN Liu; YU Hong-kun; ZENG Wei; PENG Ya-fang

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N & K Analyzer in OLED Failure Analysis

Device Technology & Physics | 更新时间：2020-08-12

- N & K Analyzer in OLED Failure Analysis
- Chinese Journal of Liquid Crystals and Displays Vol. 25, Issue 4, Pages: 582-584(2010)
- 作者机构：
  
  复旦大学材料科学系上海,200433
- 作者简介：
- 基金信息：
- DOI：
  CLC： TN383+.1
- Received：17 March 2010，
  
  Revised：02 May 2010，
  
  Published Online：20 August 2010，
  
  Published：20 August 2010
- 稿件说明：
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陈柳, 俞宏坤, 曾韡, 彭雅芳. N&K多功能薄膜分析仪在OLED失效分析中的应用[J]. 液晶与显示, 2010,25(4): 582-584

CHEN Liu, YU Hong-kun, ZENG Wei, PENG Ya-fang. N & K Analyzer in OLED Failure Analysis[J]. 液晶与显示, 2010,25(4): 582-584
陈柳, 俞宏坤, 曾韡, 彭雅芳. N&K多功能薄膜分析仪在OLED失效分析中的应用[J]. 液晶与显示, 2010,25(4): 582-584 DOI：

CHEN Liu, YU Hong-kun, ZENG Wei, PENG Ya-fang. N & K Analyzer in OLED Failure Analysis[J]. 液晶与显示, 2010,25(4): 582-584 DOI：

摘要

使用N

K多功能薄膜分析仪对OLED的结构进行分析

对比了不同时间室温老化实验样品的反射率波谱。对反射率进行计算拟合

得到OLED的多层膜结构信息。对相同室温老化实验条件下的完好器件和失效器件的结构进行了对比

发现对于结构为ITO/NPB/Alq

/LiF/Al的器件

主要是Alq

和LiF层发生变化引起器件失效。由此也证明使用N

K多功能薄膜分析仪是OLED失效分析的有效手段。

Abstract

The structure of OLED was studied by N

K analyzer and the reflectance spectrum of samples in different time duration were compared. The layers thickness information in this OLED

with a structure of ITO/NPB/Alq

/LiF/Al

can be obtained by calculating and datum fitting. By comparing the structure of different samples

it is found that the main reason of device failure lies in Alq

and LiF layer. This also indicates that N

K analysis is an effective method for OLED failure research.

关键词

Keywords

references

Hung L S, Chen C H. Recent process of molecular organic electroluminescent materials and devices

. Materials Science and Engineering:R, 2002, 39:143-222.

彭雅芳, 俞宏坤, 蒋益明. OLED器件电极腐蚀研究

. 复旦大学学报, 2008, 47(6): 769-772.

陈宏. "光学测量"的先锋

. 中国集成电路, 2006, 84: 74-75.

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QU Li-xin

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Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China

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N & K Analyzer in OLED Failure Analysis

DOI：

摘要

Abstract

关键词

Keywords

references