LI Xia-nan, YU Nai-sen, CAO Bao-sheng, ZHOU Jun-ming. Stress and Effect on Optical Properties of GaN Epilayers Grown by Using Porous SiN<sub><em>x</em></sub> Interlayers[J]. , 2010,25(6): 776-779
LI Xia-nan, YU Nai-sen, CAO Bao-sheng, ZHOU Jun-ming. Stress and Effect on Optical Properties of GaN Epilayers Grown by Using Porous SiN<sub><em>x</em></sub> Interlayers[J]. , 2010,25(6): 776-779DOI:
Stress and Effect on Optical Properties of GaN Epilayers Grown by Using Porous SiNx Interlayers
The stress state and its effect on optical properties of GaN films grown on porous SiN
x
interlayers by using metal organic chemical vapor deposition (MOCVD)method are investigated. The stress is characterized by the frequency shift based on micro-Raman spectroscopy measurement. It shows that more residual stress in GaN film grown on the SiN
x
interlayers is relaxed when the time of in situ SiN
x
deposition is increased. Accordingly
the donor bound extion(DBE) peak shows red shift in low temperature photoluminescence(PL) measurement. We assume that the increasing time of in situ SiN
x
deposition enlarging the lateral overgrowth area is the main reason to reduce the residual stress and influence corresponding optical properties.
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