Constant Stress Accelerated Life Tests and Statistical Analysis for VFD under Weibull Distribution Case

ZHANG Jian-ping; WANG Rui-tao

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Constant Stress Accelerated Life Tests and Statistical Analysis for VFD under Weibull Distribution Case

Device Technology & Physics | 更新时间：2020-08-12

- Constant Stress Accelerated Life Tests and Statistical Analysis for VFD under Weibull Distribution Case
- Chinese Journal of Liquid Crystals and Displays Vol. 25, Issue 2, Pages: 205-209(2010)
- 作者机构：
  
  上海电力学院能源与环境工程学院,上海 200090,E-mail:jpzhanglzu@163.com
- 作者简介：
- 基金信息：
- DOI：
  CLC： TN102;TN141
- Received：14 December 2008，
  
  Revised：02 January 1900，
  
  Published Online：30 April 2010，
  
  Published：30 April 2010
- 稿件说明：
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张建平;王睿韬. 威布尔分布下VFD恒定应力加速寿命试验与统计分析[J]. 液晶与显示, 2010,25(2): 205-209

ZHANG Jian-ping;WANG Rui-tao. Constant Stress Accelerated Life Tests and Statistical Analysis for VFD under Weibull Distribution Case[J]. 液晶与显示, 2010,25(2): 205-209
张建平;王睿韬. 威布尔分布下VFD恒定应力加速寿命试验与统计分析[J]. 液晶与显示, 2010,25(2): 205-209 DOI：

ZHANG Jian-ping;WANG Rui-tao. Constant Stress Accelerated Life Tests and Statistical Analysis for VFD under Weibull Distribution Case[J]. 液晶与显示, 2010,25(2): 205-209 DOI：

摘要

为了精确地估计真空荧光显示器(VFD)的可靠性寿命

节省试验测试时间

通过建立加速寿命试验模型开展了4组恒定应力加速寿命试验

采用威布尔函数描述VFD寿命分布

利用最小二乘法(LSM)估计威布尔参数

完成了试验数据的统计分析

并自行开发了寿命预测软件

确定了加速寿命方程

实现了VFD的寿命估计。数值结果表明

试验设计方案是正确可行的

VFD的寿命服从威布尔分布

其加速模型符合线性阿伦尼斯方程

每个加速应力水平下VFD的失效机理不变

精确计算出的VFD寿命对其生产厂商和技术人员具有重要的指导意义。

Abstract

In order to estimate the reliable lifetime of Vacuum Fluorescent Display (VFD) more accurately

and reduce testing time

four constant stress accelerated life tests (CSALT) were conducted by establishing accelerated life test model. The statistical analysis on test data was achieved by applying the Weibull model to describe the lifetime distribution

and Least Square Method (LSM) to estimate the Weibull parameters. Furthermore

accele-rated life equation was determined and self-developed software was employed to predict the VFD lifetime. The numerical results show that test design scheme of CSALT is correct and feasible

that the VFD lifetime follows Weibull distribution

that the life-stress relationship meets linear Arrhenius equation completely

and that the VFD failure mechanism keeps constant at each temperature stress. The proposed methods and the estimated reliable lifetime of VFD can provide some significant guideline to its manufacturers and technicians.

关键词

Keywords

references

. 阮世平. 真空荧光显示器件及驱动技术 [J]. 液晶与显示 , 1996, 11(1):75-81.

. 沈伟. 艳丽多彩的真空荧光显示屏 [J]. 液晶与显示 , 2001, 16(2):140-144.

. 张建平, 王睿韬. 基于MAM的真空荧光显示器寿命预测 [J]. 液晶与显示 , 2008, 23(6):765-770.

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. Zhang Jianping, Xie Xiuzhong, Zhao Keren. Constant-step stress accelerated life test of VFD under logarithmic normal distribution case [J]. J. Shanghai Jiaotong University (Science, English Edition), 2006, E-11(1):14-17.

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Related Institution

School of Thermal Power and Environmental Engineering, Shanghai University of Electric Power

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Key Laboratory of Advanced Display and System Applications of EMC, Shanghai University

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QM Department, Chengdu Tianma Micro-Electronics Co. Ltd.

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