Design of Defect Inspection System for FED Electrodes Based on Probe Method

ZHANG Yong-ai; ZHANG Jie; XU Hua-an; YAO Liang; GUO Tai-liang

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Design of Defect Inspection System for FED Electrodes Based on Probe Method

Device Technology & Physics | 更新时间：2020-08-12

- Design of Defect Inspection System for FED Electrodes Based on Probe Method
- Chinese Journal of Liquid Crystals and Displays Vol. 25, Issue 2, Pages: 215-219(2010)
- 作者机构：
  
  福州大学场致发射显示技术教育部工程研究中心,福建福州 350002,E-mail:yongaizhang@fzu.edu.cn
- 作者简介：
- 基金信息：
- DOI：
  CLC： TP391
- Received：19 August 2009，
  
  Revised：02 January 1900，
  
  Published Online：30 April 2010，
  
  Published：30 April 2010
- 稿件说明：
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张永爱;张杰;许华安;姚亮;郭太良. 基于探针法的FED电极缺陷检测系统设计[J]. 液晶与显示, 2010,25(2): 215-219

ZHANG Yong-ai;ZHANG Jie;XU Hua-an;YAO Liang;GUO Tai-liang. Design of Defect Inspection System for FED Electrodes Based on Probe Method[J]. 液晶与显示, 2010,25(2): 215-219
张永爱;张杰;许华安;姚亮;郭太良. 基于探针法的FED电极缺陷检测系统设计[J]. 液晶与显示, 2010,25(2): 215-219 DOI：

ZHANG Yong-ai;ZHANG Jie;XU Hua-an;YAO Liang;GUO Tai-liang. Design of Defect Inspection System for FED Electrodes Based on Probe Method[J]. 液晶与显示, 2010,25(2): 215-219 DOI：

摘要

针对FED显示屏电极的特征

提出一种FED电极缺陷检测系统

用于检测FED电极的短路和断路等缺陷。系统分为硬件和软件两部分

硬件部分由CCD摄像头初始定位和对准模块、单片机数据测试和传输模块、计算机数据接收和处理模块组成;软件部分包括单片机预处理部分的底层程序设计和计算机部分面向对象的高级程序设计。经过硬件设计安装和软件编程调试

该FED电极缺陷检测系统已经在实验中得到应用。

Abstract

In allusion to the characteristics of the FED electrode

a kind of defect inspection system for FED electrodes is proposed in this paper

which can detect the defects of short circuit and open circuit

etc. The system includes hardware and software. The hardware is composed of CCD camera (initial location and orientation)

single-chip (data testing and transmission) and computer (data receiving and processing). The software consists of program design of single-chip pretreatment and advanced programming of computer object orientation. The defect inspection system has been applied to the fabrication of FED electrodes after the design and installation of hardware and program debugging of software.

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references

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