ITO Corrosion Reliability for LCD

SONG Yu-hong; HE Lin-qiao; YANG Shun-lin

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ITO Corrosion Reliability for LCD

Test & Evaluation | 更新时间：2020-08-12

- ITO Corrosion Reliability for LCD
- Chinese Journal of Liquid Crystals and Displays Vol. 24, Issue 3, Pages: 459-463(2009)
- 作者机构：
  
  深圳市宇顺电子股份有限公司,广东深圳 518132,E-mail:yangshunlin@szsuccess.com.cn
- 作者简介：
- 基金信息：
- DOI：
  CLC： TN141.9
- Received：06 February 2009，
  
  Revised：02 January 1900，
  
  Published Online：30 June 2009，
  
  Published：30 June 2009
- 稿件说明：
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宋宇红;何林桥;杨顺林. 液晶显示器件电极腐蚀失效可靠性研究[J]. 液晶与显示, 2009,24(3): 459-463

SONG Yu-hong;HE Lin-qiao;YANG Shun-lin. ITO Corrosion Reliability for LCD[J]. 液晶与显示, 2009,24(3): 459-463
宋宇红;何林桥;杨顺林. 液晶显示器件电极腐蚀失效可靠性研究[J]. 液晶与显示, 2009,24(3): 459-463 DOI：

SONG Yu-hong;HE Lin-qiao;YANG Shun-lin. ITO Corrosion Reliability for LCD[J]. 液晶与显示, 2009,24(3): 459-463 DOI：

摘要

利用Arrhenius模型和Eyring模型分析了温度应力和湿度应力对LCD电极腐蚀可靠性的加速影响特性

并根据加速特性推导出典型的可靠性加速试验可验证的产品寿命。结果表明

温度应力和湿度应力对LCD腐蚀的加速作用都呈指数关系

典型的腐蚀可靠性验证试验条件(55 ℃95％RH24 h)所对应的LCD产品在常温常湿条件下的理论寿命约为3年。同时

试验统计了40 ℃70％RH和常温常湿条件下产品发生腐蚀失效比例随时间的趋势。结果表明

40℃70％RH48 h的条件可筛选出95％以上的潜在腐蚀失效产品。

Abstract

Using Arrhenius model and Eyring model

the reliability properties of LCD electrode corrosion were studied by corrosion acceleration experiments of LCD electrode with thermal stress & humidity stress

and a typical verifiable LCD life was derived. The results showed that corrosion velocity of LCD electrode was index function of thermal and humidity. That means

LCD products pass the reliability test at 55 ℃95% RH24 h

corresponding at least 3 years of product life at room temperature. In addition

the relationship between corrosion failure ratio of LCD products and time was discussed at 40 ℃70% RH & at room temperature

respectively. More than 95% potential corrosion failure products can be selected at 40 ℃70% RH48 h.

关键词

Keywords

references

. 黄锡珉.液晶显示技术的开发和产业化 [J] . 液晶与显示 ,2002,17(6):403-415.

. 黄锡珉. 液晶显示技术发展轨迹 [J]. 液晶与显示 ,2003,18(1):1-6.

. 王巍强.COG工艺的LCD模块电极腐蚀的控制 [J]. 液晶与显示 ,2006,21(6):696-699.

. 王辉,缴春雷,王虹. COG液晶显示模块电极腐蚀问题研究 [J]. 光电子技术 , 2006, 26(2):127-128.

. 日本学术振兴会第142 委员会编. 液晶器件手册 [M].黄锡珉,黄辉光,李之榕,等译.北京:航空工业出版社,1992:609-614.

. 徐福祯.设备可靠性试验·恒定失效率假设下的失效率与平均无故障时间的验证试验方案,GB5080.7-8,中华人民共和国国家标准[S].北京:国家标准局,1986.

. 刘婧,吕长志,李志国,等.电子元器件加速寿命试验方法的比较介绍 [J]. 半导体技术 ,2006,31(9): 44-47.

. 彭鸿霖. 可靠度技术手册·失效物理分析技术 [M].2000:9-11.

. 吴永俊,詹前贤.加速环境应力试验在COG-LCD中的应用 [J]. 电子产品可靠性与环境试验, 2004,(5): 45-48.

. 郭永基. 可靠性工程原理 [M].北京:清华大学出版社,2002:27-30.

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Related Institution

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Institute of Polymer Optoelectronic Materials and Devices, State Key Laboratory of Luminescent Materials and Devices, South China University of Technology

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