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Insulator defect detection based on improved YOLOv11n
Image Processing | 更新时间:2026-09-12
    • Insulator defect detection based on improved YOLOv11n

    • Chinese Journal of Liquid Crystals and Displays   Vol. 41, Issue 5, Pages: 687-699(2026)
    • DOI:10.37188/CJLCD.2026-0053    

      CLC: TM85;TP391.41
    • CSTR:32172.14.CJLCD.2026-0053    
    • Received:27 March 2026,

      Revised:2026-04-12,

      Published:05 May 2026

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  • LEI Dewei, LIN Guojun, MA Run, et al. Insulator defect detection based on improved YOLOv11n[J]. Chinese Journal of Liquid Crystals and Displays, 2026, 41(5): 687-699. DOI: 10.37188/CJLCD.2026-0053. CSTR: 32172.14.CJLCD.2026-0053.

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