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Optimized design and simulation of SD-OCT system for multilayer structure measurement
Device Physics and Device Preparation | 更新时间：2026-03-02

    • Optimized design and simulation of SD-OCT system for multilayer structure measurement

    • “Introduced its research progress in the field of industrial inspection, experts optimized the performance of SD-OCT system, improved resolution and scanning range, and provided a solution for multi-layer structure measurement.”
    • Chinese Journal of Liquid Crystals and Displays   Vol. 41, Issue 2, Pages: 197-207(2026)

    • DOI：10.37188/CJLCD.2025-0232    

      CLC： TH74.5;O439
    • CSTR：32172.14.CJLCD.2025-0222    

    • Received：14 November 2025，

      Revised：2026-01-10，

      Published：05 February 2026

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  • ZHOU Ying, WANG Chen, WU Jingjing, et al. Optimized design and simulation of SD-OCT system for multilayer structure measurement[J]. Chinese Journal of Liquid Crystals and Displays, 2026, 41(2): 197-207. DOI： 10.37188/CJLCD.2025-0232. CSTR： 32172.14.CJLCD.2025-0222.

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Related Institution

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State Key Laboratory of Optoelectronic Materials and Technologies
Department of Physics, Shanghai Jiao Tong University, Shanghai 200240,China,E-mail:seaver_li@163.
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