Wavefront detection method based on extended Nijboer-Zernike combined with deep neural networks
Image Processing|更新时间:2025-07-10
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Wavefront detection method based on extended Nijboer-Zernike combined with deep neural networks
“In the field of optical system detection, experts have proposed a new method that combines deep neural networks with diffraction physics models, effectively improving the accuracy of wavefront detection.”
Chinese Journal of Liquid Crystals and DisplaysVol. 40, Issue 7, Pages: 1036-1045(2025)
作者机构:
1.中国科学院 长春光学精密机械与物理研究所, 吉林 长春 130033
2.中国科学院大学, 北京 100049
作者简介:
基金信息:
National Natural Science Foundation of China(62135015)
LI Jinting, WANG Bin, DONG Lei, et al. Wavefront detection method based on extended Nijboer-Zernike combined with deep neural networks[J]. Chinese journal of liquid crystals and displays, 2025, 40(7): 1036-1045.
DOI:
LI Jinting, WANG Bin, DONG Lei, et al. Wavefront detection method based on extended Nijboer-Zernike combined with deep neural networks[J]. Chinese journal of liquid crystals and displays, 2025, 40(7): 1036-1045. DOI: 10.37188/CJLCD.2025-0060. CSTR: 32172.14.CJLCD.2025-0060.
Wavefront detection method based on extended Nijboer-Zernike combined with deep neural networks