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Mura defect detection of LCD screen based on improved YOLOv8n
Device Physics and Device Preparation | 更新时间：2025-03-06

    • Mura defect detection of LCD screen based on improved YOLOv8n

    • “In the field of Mura defect detection in LCD screens, researchers have proposed a YOLO-D3MNet model based on improved YOLOv8n, which effectively improves detection accuracy and provides a new solution for solving Mura defect detection problems.”
    • Chinese Journal of Liquid Crystals and Displays   Vol. 40, Issue 3, Pages: 439-447(2025)

    • DOI：10.37188/CJLCD.2024-0295    

      CLC： TP391
    • CSTR：32172.14.CJLCD.2024-0295    

    • Received：24 September 2024，

      Revised：22 October 2024，

      Published：05 March 2025

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  • CHEN Shunlong, LIAO Yinghua, LIN Feng, et al. Mura defect detection of LCD screen based on improved YOLOv8n[J]. Chinese journal of liquid crystals and displays, 2025, 40(3): 439-447. DOI： 10.37188/CJLCD.2024-0295. CSTR： 32172.14.CJLCD.2024-0295.

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Related Institution

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