Scene recognition based on deep metric learning and semantic segmentation
Image Processing|更新时间:2025-05-13
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Scene recognition based on deep metric learning and semantic segmentation
“In the field of scene image recognition, researchers have proposed a novel semantic segmentation framework that improves model recognition accuracy and enhances the accuracy and robustness of scene recognition through deep metric learning.”
Chinese Journal of Liquid Crystals and DisplaysVol. 40, Issue 5, Pages: 740-750(2025)
作者机构:
1.中国科学院 长春光学精密机械与物理研究所, 吉林 长春 130033
2.中国科学院大学, 北京 100049
作者简介:
基金信息:
National Defense Science and Technology Innovation Special Zone Project (No.18-H863-00-TS-002-018-01)
JIA Xuan, ZHANG Ye, CHANG Xuling, et al. Scene recognition based on deep metric learning and semantic segmentation[J]. Chinese journal of liquid crystals and displays, 2025, 40(5): 740-750.
DOI:
JIA Xuan, ZHANG Ye, CHANG Xuling, et al. Scene recognition based on deep metric learning and semantic segmentation[J]. Chinese journal of liquid crystals and displays, 2025, 40(5): 740-750. DOI: 10.37188/CJLCD.2024-0288. CSTR: 32172.14.CJLCD.2024-0288.
Scene recognition based on deep metric learning and semantic segmentation