基于暗电流CMOS图像传感器固定模式噪声校正研究

李强; 金龙旭; 李国宁

doi:10.37188/CJLCD.2020-0176

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基于暗电流CMOS图像传感器固定模式噪声校正研究

图像处理 | 更新时间：2021-02-07

- 基于暗电流CMOS图像传感器固定模式噪声校正研究
- Fixed pattern noise correction of CMOS image sensor based on dark current
- 液晶与显示 2021年36卷第2期页码：327-333
- 作者机构：
  
  中国科学院长春光学精密机械与物理研究所, 吉林长春 130033
- 作者简介：
  
  [ "李强(1985-), 男, 吉林长春人, 硕士, 2019年于吉林大学获得硕士学位, 主要从事显示成像、光电成像及图像处理方面的研究。E-mail: 14107666@qq.com" ]
  [ "金龙旭(1965-), 男, 吉林长春人, 博士, 研究员, 2003年于中国科学院长春光学精密机械与物理研究所获得博士学位, 主要从事光电成像及图像处理方面的研究。E-mail:jinlx@ciomp.ac.cn" ]
- 基金信息：
  
  十三五国家重点研发计划(2017YFB0404800)
- DOI：10.37188/CJLCD.2020-0176
  中图分类号： TN492
- 收稿日期：2020-07-07，
  
  修回日期：2020-09-16，
  
  录用日期：2020-9-16，
  
  纸质出版日期：2021-02
- 稿件说明：
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李强, 金龙旭, 李国宁. 基于暗电流CMOS图像传感器固定模式噪声校正研究[J]. 液晶与显示, 2021,36(2):327-333.

Qiang LI, Long-xu JIN, Guo-ning LI. Fixed pattern noise correction of CMOS image sensor based on dark current[J]. Chinese journal of liquid crystals and displays, 2021, 36(2): 327-333.
李强, 金龙旭, 李国宁. 基于暗电流CMOS图像传感器固定模式噪声校正研究[J]. 液晶与显示, 2021,36(2):327-333. DOI： 10.37188/CJLCD.2020-0176.

Qiang LI, Long-xu JIN, Guo-ning LI. Fixed pattern noise correction of CMOS image sensor based on dark current[J]. Chinese journal of liquid crystals and displays, 2021, 36(2): 327-333. DOI： 10.37188/CJLCD.2020-0176.

摘要

为了抑制由读出放大电路增益不一致导致的CMOS传感器固定模式噪声（FPN），提高成像质量，本文提出了基于暗电流的固定模式噪声校正方法。该方法相比于传统校正方法具有校正系统简单，算法易于实现的优点。本文对校正前后的图像通过灰度方差进行评估，评估结果表明：由暗电流形成的本底图像，图像灰度方差校正后相比于校正前，降低1~2个数量级；均匀光照条件下的CMOS图像，校正后相比于校正前，图像灰度方差增大2个数量级。该评估结果及相关结论对暗电流本底图像及相关校正方法探讨具有一定的借鉴意义。

Abstract

In order to restrain the effect of CMOS image sensor fixed pattern noise(FPN) caused by the gain mismatch of readout amplifier circuit

to improve the quality of imaging

a method of fixed pattern noise correction based on the dark current is proposed in this paper. Compared with the traditional correction methods

this method has simple correction system

and the algorithm is easy to be implemented. The images before and after correction were evaluated via the grayscale variance

and the evaluation results show that in the background image formed by dark current

the grayscale variance of after corrected image reduced by 4 orders of magnitude compared with that before correction. As for the CMOS image under uniform illumination condition

the grayscale variance of after corrected image increased by 2 orders of magnitude compared with that before correction. The evaluation results and related conclusions are useful for the future study of dark current background images and correlation correction methods.

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Keywords

references

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